OMP400 is the latest generation optical probe using strain gage technology.
Measuring just 40 mm diameter × 50 mm in length, OMP400 is suitable
for all machining and mill-turn centers requiring uncompromised 3D
metrology performance. Utilizing a revised state-of-the-art modulated optical
transmission method, the system offers the highest level of resistance to light
interference when used with OMI-2. The OMP400 probe is also compatible
with existing OMM/MI12 and OMI receivers, enabling current MP7, MP8,
MP9 and MP10 system users to benefit from its innovative features.
Sense directions ±X, ±Y, +Z
Stylus overtravel
X and Y: ±18°
Z: 11 mm (0.43 in)
Stylus trigger force
(factory set using 50 mm stylus)
X and Y: 2 gf
Z: 15 gf
Unidirectional repeatability
(max 2 sigma value)
0.25 μm (0.00001 in)
